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NEW TECHNOLOGY

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ACTIVE LAYER PARAMETRICS(ALP)

[CA , USA] 






Features


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ALPro™ technology has the capability to provide complete electrical characterization of semiconductor layers at atomic-scale depth resolution, rapidly and economically, to enable efficient process development, modeling and reliable manufacturing control.



Website

Active Layer Parametrics, Inc. – Electrical Characterization of Ultrathin Layers (alpinc.net)

(https://www.alpinc.net/) 


 


Products 

ALPro™ 50, ALPro™ 100



Application 

Depth profiling of semiconductor layers

  • 다음글EUVT 23.07.18