ACTIVE LAYER PARAMETRICS(ALP)
[CA , USA]
ALPro™ technology has the capability to provide complete electrical characterization of semiconductor layers at atomic-scale depth resolution, rapidly and economically, to enable efficient process development, modeling and reliable manufacturing control.
ALPro™ 50, ALPro™ 100
Depth profiling of semiconductor layers
- 다음글EUVT 23.07.18