FOOTHILL > IT Solutions

제품소개
제품소개 METROLOGY

METROLOGY

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FOOTHILL INSTRUMENTS(FOOTHILL)

[San Juan , USA] 





Features


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FOOTHILL’s product has been designed to measure the thickness of "thin" films deposited on a variety of substrates. 

The hardware includes an automated stage to move the wafer to different measurement sites.




Website

foothill instruments – layer thickness metrology systems (foothill-instruments.com)

(https://www.foothill-instruments.com/)




Products 

KV-300 etc.




Application 

Film Thickness Measuring