ALP > IT Solutions

ACTIVE LAYER PARAMETRICS(ALP)

[CA , USA] 

Features

ALPro™ technology has the capability to provide complete electrical characterization of semiconductor layers at atomic-scale depth resolution, 

rapidly and economically, to enable efficient process development, modeling and reliable manufacturing control.

Website

Active Layer Parametrics, Inc. – Electrical Characterization of Ultrathin Layers (alpinc.net)

(https://www.alpinc.net/)

Products 

ALPro™50 & ALPro™100 Profilers

Application 

Electrical parameter depth profiles