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Product METROLOGY

METROLOGY

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INTEGO

[Erlangen , Germany] 





Features



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Both (semi) transparent and standard opaque wafers can be inspected with Intego’s systems. 

Inspection solutions for standard and advanced semiconductor materials like Si, SiC, GaN, GaAs, 

Ge as well as for device manufacturing processes of LED, OLED and MEMS can be offered.



Website

Intego GmbH – Home


  


Products 

Inspection of Brick Shaped Products etc.



Application 

Inspection (Defects, Geometry)